4

High-sensitivity depth profiling of arsenic and phosphorus in silicon by means of SIMS

Year:
1976
Language:
english
File:
PDF, 432 KB
english, 1976
10

Depth resolution in sputter profiling: Evidence against the sequential layer sputtering model

Year:
1978
Language:
english
File:
PDF, 607 KB
english, 1978
17

Ranges of low-energy, light ions in amorphous silicon

Year:
1983
Language:
english
File:
PDF, 434 KB
english, 1983
18

Erosion of long-term wall samples in JET

Year:
1987
Language:
english
File:
PDF, 373 KB
english, 1987
19

An averaging method applied to a duffing equation

Year:
1996
Language:
english
File:
PDF, 234 KB
english, 1996
22

Functioning of normal and ectopic electroreceptors

Year:
1991
Language:
english
File:
PDF, 254 KB
english, 1991
23

Volume expansion and oxygen incorporation in deuteron-bombarded silicon

Year:
1980
Language:
english
File:
PDF, 709 KB
english, 1980
28

Über den Tonus der Sinnesendstellen des Innenohres

Year:
1931
Language:
german
File:
PDF, 798 KB
german, 1931
29

Finnlandby I. Leiviskä

Year:
1941
Language:
german
File:
PDF, 407 KB
german, 1941
34

Penalties plus high-quality review to fight plagiarism

Year:
2005
Language:
english
File:
PDF, 94 KB
english, 2005
38

Die Prüfung der Formalitäten der Rechtsmittel von Amtswegen

Year:
1902
Language:
german
File:
PDF, 1.28 MB
german, 1902
40

Existence of multiple ordered solutions for a semilinear elliptic boundary value problem

Year:
1998
Language:
english
File:
PDF, 273 KB
english, 1998
42

Corflow: A Code for the Numerical Simulation of Free-Surface Flow

Year:
1997
Language:
english
File:
PDF, 8.72 MB
english, 1997
45

Eine neue Stütze der Helmholtz'schen Resonanztheorie

Year:
1907
Language:
german
File:
PDF, 425 KB
german, 1907
47

Die Ursache der Otosklerose

Year:
1931
Language:
german
File:
PDF, 3.17 MB
german, 1931